Determination of Characteristic Relaxation Times And Their Significance In Copper Oxide Thin Film
The copper oxide thin film was characterized using both the theoretical and experimental approach at different oxidation temperatures between 150oC to 450oC.
Published at Journal of the theoretical Physics and Cryptography 4(1)1-4
Published in 2013
Moses E Emetere & Muhammad M Bakeko
Emetere Moses » Emetere, Moses Eterigho is a seasoned researcher. He was awarded the prestigious African Union (AU) & The World Academic of Science (TWAS) award for his numerous research accomplishments- 2015 AU/TWAS Young Scientist National Award. He has published over one hundred and fifty peered reviewed papers and textbooks. His research work has attracted international collaboration from Malaysia,... view full profile
